An Effective Test Pattern Generation for Testing Signal Integrity

As more cores are integrated in a single chip with sophisticated process like nanotechnology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this met...

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Bibliographic Details
Main Authors:	Yongjoon Kim, Myung-Hoon Yang, Youngkyu Park, DaeYeal Lee, Sungho Kang
Format:	Conference Proceeding
Language:	eng
Subjects:	Built-in self-test Capacitance Electronic equipment testing Hardware Inductance Manufacturing processes Mutual coupling Signal processing System-on-a-chip Test pattern generators
Online Access:	Request full text
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Summary:	As more cores are integrated in a single chip with sophisticated process like nanotechnology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme
ISSN:	1081-7735 2377-5386