Gate bias aging of unhydrogenated polycrystalline silicon TFTs

Saved in:
Bibliographic Details
Main Authors: Tala-Ighil, B., Toutah, A., Mohammed-Brahim, T., Mourgues, K., Raoult, F., Lhermite, H., Bonnaud, O.
Format: Conference Proceeding
Language:English
Subjects:
Active matrix liquid crystal displays
Aging
Amorphous silicon
Crystalline materials
Plasma applications
Plasma chemistry
Plasma sources
Stress
Thin film transistors
Threshold voltage
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
DOI:10.1109/ESSDERC.1997.194502