Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)

Heavy-ion irradiation and fault injection experiments were conducted to evaluate the upset sensitivity of the Xilinx Virtex-II field programmable gate arrays (FPGAs) input/output block (IOB). Full triple module redundancy (TMR) of the IOBs, in combination with regular configuration scrubbing, proved...

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Bibliographic Details

Published in:	IEEE transactions on nuclear science 2004-12, Vol.51 (6), p.3469-3474
Main Authors:	Swift, G.M., Rezgui, S., George, J., Carmichael, C., Napier, M., Maksymowicz, J., Moore, J., Lesea, A., Koga, R., Wrobel, T.F.
Format:	Article
Language:	eng
Subjects:	Aerodynamics Dynamics Fault injection Faults Field programmable gate arrays Irradiation Laboratories Modules NASA Propulsion Radiation effects reconfigurable field programmable gate arrays (FPGAs) Redundancy Scrubbing Single event transient single-event effects Software tools Testing
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