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Time-domain pulsed large-signal non-linear characterization of microwave transistors

Breaking-up the limitations of VNAs for RF non-linear measurements, the LSNA (large signal network analyser) allows time domain characterizations of full two-port active devices. We demonstrate here some capabilities of the LSNA for pulsed RF signals. We establish a stroboscopic mode based on 3 diff...

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Main Authors:	Charbonniaud, C., Teyssier, J.P., Quere, R.
Format:	Conference Proceeding
Language:	English
Subjects:	Calibration Diodes Frequency conversion Frequency domain analysis Frequency synthesizers Microwave measurements Microwave transistors Radio frequency RF signals Time domain analysis
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creator	Charbonniaud, C. Teyssier, J.P. Quere, R.
description	Breaking-up the limitations of VNAs for RF non-linear measurements, the LSNA (large signal network analyser) allows time domain characterizations of full two-port active devices. We demonstrate here some capabilities of the LSNA for pulsed RF signals. We establish a stroboscopic mode based on 3 different sampling techniques. This approach is suitable for repetitive pulsed RF signals.
doi_str_mv	10.1109/EUMC.2003.1262264
format	conference_proceeding
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Calibration Diodes Frequency conversion Frequency domain analysis Frequency synthesizers Microwave measurements Microwave transistors Radio frequency RF signals Time domain analysis
title	Time-domain pulsed large-signal non-linear characterization of microwave transistors
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