Time-domain pulsed large-signal non-linear characterization of microwave transistors

Breaking-up the limitations of VNAs for RF non-linear measurements, the LSNA (large signal network analyser) allows time domain characterizations of full two-port active devices. We demonstrate here some capabilities of the LSNA for pulsed RF signals. We establish a stroboscopic mode based on 3 diff...

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Bibliographic Details
Main Authors: Charbonniaud, C., Teyssier, J.P., Quere, R.
Format: Conference Proceeding
Language:English
Subjects:
Calibration
Diodes
Frequency conversion
Frequency domain analysis
Frequency synthesizers
Microwave measurements
Microwave transistors
Radio frequency
RF signals
Time domain analysis
Online Access:Request full text
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Summary:Breaking-up the limitations of VNAs for RF non-linear measurements, the LSNA (large signal network analyser) allows time domain characterizations of full two-port active devices. We demonstrate here some capabilities of the LSNA for pulsed RF signals. We establish a stroboscopic mode based on 3 different sampling techniques. This approach is suitable for repetitive pulsed RF signals.
DOI:10.1109/EUMC.2003.1262264