Design retargetable platform system for microprocessor functional test

Microprocessors are extremely versatile and complexity that present significantly test challenges. This paper describes a retargetable functional test platform system design for various microprocessors. Characterized by configurable test environment generator, retargetable assembler and strong ATPG...

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Bibliographic Details
Main Authors: Liu Ling, Feng Wennan, Jia Song, Jiang Anping, Ji Lijiu
Format: Conference Proceeding
Language:English
Subjects:
Design for testability
Integrated circuit testing
Microprocessors
Online Access:Request full text
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Description
Summary:Microprocessors are extremely versatile and complexity that present significantly test challenges. This paper describes a retargetable functional test platform system design for various microprocessors. Characterized by configurable test environment generator, retargetable assembler and strong ATPG the platform system could automatically produce different test environment and assemble out relative test codes to adapt to the microprocessor under test. Experiments show that the platform system works correctly, flexibly and efficiently.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2003.1250856