Experimental demonstration of spatial hole burning reduction leading to 1480-nm pump lasers output power improvement

Observation of spatial hole burning reduction is reported for the first time to our knowledge on flared 1480-nm high-power InGaAsP-InP buried ridge lasers. We determined the longitudinal carrier density profile by spatially resolved spontaneous emission measurements for slightly tapered and straight...

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Bibliographic Details
Published in:IEEE photonics technology letters 2005-10, Vol.17 (10), p.2023-2025
Main Authors: Guermache, A., Voiriot, V., Locatelli, D., Legrand, F., Capella, R.-M., Gallion, P., Jacquet, J.
Format: Article
Language:English
Subjects:
Charge carrier density
Engineering Sciences
Flared waveguide
Hole burning
Laser excitation
Laser outputs
Lasers
Optical waveguides
Photonics
Power amplifiers
Power generation
Power lasers
Pump lasers
Pumps
Reduction
Ridges
Semiconductor lasers
Spontaneous emission
Waveguide lasers
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Summary:Observation of spatial hole burning reduction is reported for the first time to our knowledge on flared 1480-nm high-power InGaAsP-InP buried ridge lasers. We determined the longitudinal carrier density profile by spatially resolved spontaneous emission measurements for slightly tapered and straight active waveguides. The tapered stripe shows spatial hole burning reduction leading to 25% output power enhancement.
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2005.854386