Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110 MHz)

Nowadays, the characterization of planar integrated components is a challenge. The objective is to characterize these devices on a broadband frequency (from a few Hz to a few GHz). Currently, these integrated devices cannot be characterized at low frequencies (less than 1 MHz). This paper presents a...

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Bibliographic Details
Published in:Journal of electronic testing 2019-04, Vol.35 (2), p.245-252
Main Authors: Oumar, D. A., Boukhari, M. I., Taha, M. A., Capraro, S., Piétroy, D., Chatelon, J. P., Rousseau, J. J.
Format: Article
Language:English
Subjects:
Broadband
CAE) and Design
Circuits and Systems
Computer-Aided Engineering (CAD
Correlation analysis
Devices
Electrical Engineering
Electrical impedance
Engineering
Engineering Sciences
Frequencies
Magnetic devices
Measuring instruments
Micro and nanotechnologies
Microelectronics
Network analysers
Systems integration
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Summary:Nowadays, the characterization of planar integrated components is a challenge. The objective is to characterize these devices on a broadband frequency (from a few Hz to a few GHz). Currently, these integrated devices cannot be characterized at low frequencies (less than 1 MHz). This paper presents a new method and techniques for measuring integrated devices where their operating frequencies are up to 100 MHz. Indeed, by using an impedance-meter in the frequency band of 40 Hz to 110 MHz, integrated magnetic transformers have been characterized. In order to validate this method, a comparison made by a vector network analyzer has been made on the frequency band overlap (2 MHz to 110 MHz). This new method consists in measuring the impedance and admittance matrices of the device in order to determine the electronic properties of the component. The results obtained using two measurement instruments present a good correlation on the frequency band overlap. The measurement uncertainties are equal to 2% for the impedance-meter and 1% with the vector network analyzer. This comparison validates the good performance of the techniques and methods developed for characterizing integrated components.
ISSN:0923-8174
1573-0727
DOI:10.1007/s10836-019-05790-3