Picometer-scale surface roughness measurements inside hollow glass fibres

A differential profilometry technique is adapted to the problem of measuring the roughness of hollow glass fibres by use of immersion objectives and index-matching liquid. The technique can achieve picometer level sensitivity. Cross validation with AFM measurements is obtained through use of vitreou...

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Bibliographic Details
Published in:Optics express 2014-12, Vol.22 (24), p.29554-29567
Main Authors: Brun, C, Buet, X, Bresson, B, Capelle, M S, Ciccotti, M, Ghomari, A, Lecomte, P, Roger, J P, Petrovich, M N, Poletti, F, Richardson, D J, Vandembroucq, D, Tessier, G
Format: Article
Language:English
Subjects:
Glass - chemistry
Interferometry - instrumentation
Ions
Optics
Physics
Silicon Dioxide - chemistry
Surface Properties
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Summary:A differential profilometry technique is adapted to the problem of measuring the roughness of hollow glass fibres by use of immersion objectives and index-matching liquid. The technique can achieve picometer level sensitivity. Cross validation with AFM measurements is obtained through use of vitreous silica step calibration samples. Measurements on the inner surfaces of fibre-sized glass capillaries drawn from high purity suprasil F300 tubes show a sub-nanometer roughness, and the roughness power spectrum measured in the range [5 · 10(-3) m(-1) 10(-1) m(-1)] is consistent with the description of the glass surface as a superposition of frozen capillary waves. The surface roughness spectrum of two capillary tubes of differing compositions can be quantitatively distinguished.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.22.029554