Phase evaluation for electronic speckle-pattern interferometry deformation analyses

A new, handy method to evaluate phase data from fringe patterns produced by electronic speckle-pattern interferometry is proposed. The method is capable of evaluating phase data by simply taking speckle images and performing arithmetic operations on them. No extra optics or phase modulation is neede...

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Bibliographic Details
Published in:Applied optics (2004) 1995, Vol.20 (7), p.755-757
Main Authors: Yoshida, Sanichiro, Suprapedi, Dr, Widiastuti, Rini, Astuti, Edi Tri, Kusnowo, Anung
Format: Article
Language:English
Subjects:
Physics
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Summary:A new, handy method to evaluate phase data from fringe patterns produced by electronic speckle-pattern interferometry is proposed. The method is capable of evaluating phase data by simply taking speckle images and performing arithmetic operations on them. No extra optics or phase modulation is needed. Experiments have been carried out to prove the validity of the principle and demonstrate the capability of applications to practical deformation analyses.
ISSN:1559-128X
2155-3165