Lightweight CNN Models for Product Defect Detection with Edge Computing in Manufacturing Industries

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Bibliographic Details
Published in:Journal of scientific & industrial research (New Delhi, India : 1963) India : 1963), 2023-04, Vol.82 (4)
Format: Article
Language:English
Online Access:Get full text
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ISSN:0022-4456
0975-1084
DOI:10.56042/jsir.v82i04.72390