SH-Wave Scattering From the Interface Defect

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field...

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Bibliographic Details
Published in:Advances in Cyber-Physical Systems 2017-12, Vol.5 (1), p.45-50
Main Authors: Voytko, Myron, Kulynych, Yaroslav, Kuryliak, Dozyslav
Format: Article
Language:English
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Summary:The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.
ISSN:2524-0382
2707-0069
DOI:10.23939/acps2020.01.045