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Ion-assisted deposition of aluminum nitride on the fluorozirconate glass surface

Aluminum nitride films were grown on the surface of the fluorozirconate glass by an ion-assisted deposition (IAD) method. The films did not affect the infrared transmission of the glass. The Al-N bonding in the films was confirmed by the IR absorption band centered around 650 cm -1 . The absorption...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1991-07, Vol.30 (7B), p.L1314-L1316
Main Authors: DAI, Y, KAWAGUCHI, T, OSUKA, T, TADA, M, SUZUKI, K, SUZUKI, S, MASUI, A
Format: Article
Language:English
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Summary:Aluminum nitride films were grown on the surface of the fluorozirconate glass by an ion-assisted deposition (IAD) method. The films did not affect the infrared transmission of the glass. The Al-N bonding in the films was confirmed by the IR absorption band centered around 650 cm -1 . The absorption decreased with assist ion beam current, which is attributed to the reduction of film thickness by the sputtering effect and agrees well in trend with the changes in visible transmission and thickness. The glass surface with the films exhibits good resistance to himidity.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.30.l1314