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Ion-assisted deposition of aluminum nitride on the fluorozirconate glass surface
Aluminum nitride films were grown on the surface of the fluorozirconate glass by an ion-assisted deposition (IAD) method. The films did not affect the infrared transmission of the glass. The Al-N bonding in the films was confirmed by the IR absorption band centered around 650 cm -1 . The absorption...
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Published in: | Japanese Journal of Applied Physics 1991-07, Vol.30 (7B), p.L1314-L1316 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Aluminum nitride films were grown on the surface of the fluorozirconate glass by an ion-assisted deposition (IAD) method. The films did not affect the infrared transmission of the glass. The Al-N bonding in the films was confirmed by the IR absorption band centered around 650 cm
-1
. The absorption decreased with assist ion beam current, which is attributed to the reduction of film thickness by the sputtering effect and agrees well in trend with the changes in visible transmission and thickness. The glass surface with the films exhibits good resistance to himidity. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/jjap.30.l1314 |