Structural characterization of quantum-well layers by double-crystal X-ray diffractometry

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Bibliographic Details
Published in:Crystallography reports 2003-09, Vol.48 (5), p.728-743
Main Authors: Afanas’ev, A. M., Imamov, R. M.
Format: Article
Language:English
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ISSN:1063-7745
1562-689X
DOI:10.1134/1.1612593