Critical voltage growth rate when initiating the ultrafast impact ionization front in a diode structure

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2000-01, Vol.34 (6), p.665-667
Main Authors: Minarskii, A. M., Rodin, P. B.
Format: Article
Language:English
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ISSN:1063-7826
1090-6479
DOI:10.1134/1.1188051