Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths

Characterization of the vacuum ultraviolet (VUV) reflectance of silicon photomultipliers (SiPMs) is important for large-scale SiPM-based photodetector systems. We report the angular dependence of the specular reflectance in vacuum of SiPMs manufactured by Fondazionc Bruno Kessler (FBK) and Hamamatsu...

Full description

Bibliographic Details

Published in:	IEEE transactions on nuclear science 2020-12, Vol.67 (12), p.2501-2510
Main Authors:	Cao, G. F., Wen, L. J., Kharusi, S. Al, Anton, G., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Brodsky, J. P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, L., Chambers, C., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Mesrobian-Kabakian, A. Der, DeVoe, R., Vacri, M. L. Di, Ding, Y. Y., Echevers, J., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fucarino, A., Gallina, G., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E. V., Heffner, M., Hoppe, E. W., Hobl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M. J., Karelin, A., Kaufman, L. J., Koffas, T., Krucken, R., Kuchenkov, A., Leach, K. G., Leonard, D. S., Li, S., Li, Z., Licciardi, C., McElroy, T., Mong, B., Moore, D. C., Nakarmi, P., Natzke, C. R., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Parent, S., Pocar, A., Raguzin, E., Richman, M., Rossignol, T., Rowson, P. C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., Stekhanov, V., Tarka, M., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Vivo-Vilches, C., Wager, T., Walent, M., Wang, Q., Wei, W., Wu, S. X., Wu, W. H., Wu, X., Yang, H., Yang, L., Zeldovich, O., Zhou, Y.
Format:	Article
Language:	eng
Subjects:	Dependence Diffuse reflectance Engineering - Instrumentation related to nuclear science and technology, Physics - Nuclear physics and radiation physics Laser beams Measurement by laser beam NUCLEAR PHYSICS AND RADIATION PHYSICS Optical variables measurement Oxide coatings Photodetectors Photomultiplier tubes photon detection efficiency (PDE) Photonics Reflectance Refractivity Silicon silicon photomultiplier (SiPM) Silicon wafers specular reflectance Surface treatment Ultraviolet reflection Vacuum vacuum ultraviolet (VUV) Wavelengths Xenon
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!