Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies

Ultrahigh-energy (UHE) heavy ions show various advantages at testing single-event effect (SEE) in modern technologies, due to their highly penetrating nature. However, the intercepting material in the beam line contributes to the modification of the beam structure by generation of fragments produced...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2020-07, Vol.67 (7), p.1530-1539
Main Authors: Wyrwoll, Vanessa, Alia, Ruben Garcia, Roed, Ketil, Cazzaniga, Carlo, Kastriotou, Maria, Fernandez-Martinez, Pablo, Coronetti, Andrea, Cerutti, Francesco
Format: Article
Language:eng ; nor
Subjects:
CERN
Computer simulation
Detectors
FLUKA
Fragments
Heavy ions
Ion beams
Ionization
Ions
Monte Carlo methods
Monte Carlo simulation
Nuclear interactions
Particle beams
Silicon
Single Event Effects
single-event effects (SEEs)
Testing
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Description
Summary:Ultrahigh-energy (UHE) heavy ions show various advantages at testing single-event effect (SEE) in modern technologies, due to their highly penetrating nature. However, the intercepting material in the beam line contributes to the modification of the beam structure by generation of fragments produced via nuclear interactions. This is especially relevant for UHE heavy ion beams, representative of energies in space, which are not fully investigated through conventional ground-level testing. This article is dedicated to the study of the longitudinal energy deposition mechanisms in silicon by the aforementioned heavy ion beams and their fragments. The presented studies have been carried out using Monte Carlo simulations triggered by experimentally observed phenomena.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2020.2994370