Power reflection coefficient analysis for complex impedances in RFID tag design

Kurokawa's method of calculating the power reflection coefficient from the Smith chart in the situation when one complex impedance is directly connected to another is applied to passive RFID tag design, where power reflection is important, as it determines the tag characteristics. The performan...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 2005-09, Vol.53 (9), p.2721-2725
Main Authors: Nikitin, P.V., Rao, K.V.S., Lam, S.F., Pillai, V., Martinez, R., Heinrich, H.
Format: Article
Language:English
Subjects:
Antennas
Applied sciences
Circuits
Design engineering
Design. Technologies. Operation analysis. Testing
Diffraction, scattering, reflection
Electronics
Exact sciences and technology
Impedance
Integrated circuits
integrated circuits (ICs)
Mathematical analysis
Microwaves
Passive RFID tags
Performance analysis
Power generation
power reflection
Propagation losses
Radio frequency identification
Radiocommunications
Radiofrequency identification
Radiolocalization and radionavigation
Radiowave propagation
Reflection
Reflection coefficient
RF identification (RFID)
RFID tags
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Smith chart
Technical Activities Guide -TAG
Telecommunications
Telecommunications and information theory
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Description
Summary:Kurokawa's method of calculating the power reflection coefficient from the Smith chart in the situation when one complex impedance is directly connected to another is applied to passive RFID tag design, where power reflection is important, as it determines the tag characteristics. The performance analysis of a specific RFID tag is presented together with experimental data, which is in close agreement with the theory.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.2005.854191