Performance Degradation of Flexible Si Nanomembrane Transistors With Al 2 O 3 and SiO 2 Dielectrics Under Mechanical Stress

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Bibliographic Details
Published in:IEEE transactions on electron devices 2018-07, Vol.65 (7), p.3069-3072
Main Authors: Kim, Seung-Yoon, Bong, Jae Hoon, Kim, Dong Jun, Kim, Choong Sun, Choi, Hyeongdo, Hwang, Wan Sik, Cho, Byung Jin
Format: Article
Language:English
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ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2018.2831705