Ir Film Structural Properties for TES Application

Iridium films grown by pulsed laser deposition (PLD) show different critical temperatures ( T c ), which can be almost twice the T c of the bulk. This difference is related to the thickness and deposition conditions. To understand this effect, we grew different films with different configuration par...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2023-08, Vol.33 (5), p.1-4
Main Authors: Ferrari Barusso, L., Tugliani, S., Fedkevych, M., Celasco, E., Gallucci, G., Grosso, D., Manfrinetti, P., Niazi, K., Gatti, F.
Format: Article
Language:English
Subjects:
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critical temperature
Extraterrestrial measurements
Film growth
Gold
Grain size
Iridium
iridum
PLD
Pulsed laser deposition
Pulsed lasers
Silicon
Substrates
superconductivity
Temperature measurement
TES
X-ray diffraction
X-ray scattering
X-rays astrophysics
XRD
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Description
Summary:Iridium films grown by pulsed laser deposition (PLD) show different critical temperatures ( T c ), which can be almost twice the T c of the bulk. This difference is related to the thickness and deposition conditions. To understand this effect, we grew different films with different configuration parameters: laser focusing, distance to the Ir target, and deposition time. We then measured the T c and analyzed the film with structural measurements by X-ray diffraction (XRD), looking at a possible correlation with the grain size of the film itself. The work was performed to determine the film growth conditions at which it is possible to obtain predetermination of T c with good accuracy using XRD pattern characteristics of Ir films.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2023.3257822