Response of advanced bipolar processes to ionizing radiation

Ionizing radiation induced gain degradation in microcircuit bipolar polysilicon and crystalline emitter transistors is investigated. In this work, /sup 60/Co irradiation testing was performed on bipolar test structures. The effects of collector bias, dose rate, and anneal temperature are discussed....

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Bibliographic Details

Published in:	IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1991-12, Vol.38 (6), p.1342-1351
Main Authors:	Enlow, E.W., Pease, R.L., Combs, W., Schrimpf, R.D., Nowlin, R.N.
Format:	Article
Language:	eng
Subjects:	426000 > Engineering-- Components, Electron Devices & Circuits-- (1990-) AMPLIFICATION ANNEALING Applied sciences BETA DECAY RADIOISOTOPES BETA-MINUS DECAY RADIOISOTOPES Bipolar transistors COBALT 60 COBALT ISOTOPES Cranes Crystallization CRYSTALS Degradation Design. Technologies. Operation analysis. Testing DOSE RATES ELECTRONIC CIRCUITS Electronics ELEMENTS ENGINEERING Exact sciences and technology GAIN HARDENING HEAT TREATMENTS INHIBITION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Integrated circuits INTERMEDIATE MASS NUCLEI INTERNAL CONVERSION RADIOISOTOPES IONIZATION Ionizing radiation ISOMERIC TRANSITION ISOTOPES ISOTOPES MICROELECTRONIC CIRCUITS MINUTES LIVING RADIOISOTOPES NUCLEI ODD-ODD NUCLEI Performance evaluation PHYSICAL RADIATION EFFECTS POLYCRYSTALS RADIATION EFFECTS RADIATION HARDENING RADIOISOTOPES SEMICONDUCTOR DEVICES Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SEMIMETALS SILICON Temperature TEMPERATURE DEPENDENCE TESTING TRANSISTORS Weapons YEARS LIVING RADIOISOT 440200 > Radiation Effects on Instrument Components, Instruments, or Electronic Systems
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