Direct measurement of the effective infrared dielectric response of a highly doped semiconductor metamaterial

We have investigated the effective dielectric response of a subwavelength grating made of highly doped semiconductors (HDS) excited in reflection, using numerical simulations and spectroscopic measurement. The studied system can exhibit strong localized surface resonances and has, therefore, a great...

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Bibliographic Details
Published in:Nanotechnology 2017-03, Vol.28 (12), p.125701-125701
Main Authors: Al Mohtar, Abeer, Kazan, Michel, Taliercio, Thierry, Cerutti, Laurent, Blaize, Sylvain, Bruyant, Aurélien
Format: Article
Language:English
Subjects:
effective dielectric function
effective medium
Electronics
Engineering Sciences
FTIR spectroscopy
highly doped semiconductors
plasmonic metamaterial
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Summary:We have investigated the effective dielectric response of a subwavelength grating made of highly doped semiconductors (HDS) excited in reflection, using numerical simulations and spectroscopic measurement. The studied system can exhibit strong localized surface resonances and has, therefore, a great potential for surface-enhanced infrared absorption (SEIRA) spectroscopy application. It consists of a highly doped InAsSb grating deposited on lattice-matched GaSb. The numerical analysis demonstrated that the resonance frequencies can be inferred from the dielectric function of an equivalent homogeneous slab by accounting for the complex reflectivity of the composite layer. Fourier transform infrared reflectivity (FTIR) measurements, analyzed with the Kramers-Kronig conversion technique, were used to deduce the effective response in reflection of the investigated system. From the knowledge of this phenomenological dielectric function, transversal and longitudinal energy-loss functions were extracted and attributed to transverse and longitudinal resonance modes frequencies.
ISSN:0957-4484
1361-6528
DOI:10.1088/1361-6528/aa5ddf