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Small-angle X-ray scattering investigation of deformation-induced nanovoids in AA6063 aluminium alloy

Small-angle X-ray scattering studies of microstructure in metallic systems are prone to contamination by double Bragg scattering from the crystalline matrix. This is particularly problematic to the study of fracture in ductile metals via the nucleation and growth of nanovoids in response to plastic...

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Bibliographic Details
Published in:Philosophical magazine (Abingdon, England) England), 2017-10, Vol.97 (28), p.2496-2513
Main Authors: Singh, M. A., Saimoto, S., Langille, M. R., Lévesque, J., Inal, K., Woll, A. R.
Format: Article
Language:English
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Summary:Small-angle X-ray scattering studies of microstructure in metallic systems are prone to contamination by double Bragg scattering from the crystalline matrix. This is particularly problematic to the study of fracture in ductile metals via the nucleation and growth of nanovoids in response to plastic deformation. We show clear evidence of the presence of these scattering artefacts in the scattering data from representative Al systems and describe a simple method of numerically isolating and removing potentially misleading information to reveal the true small angle scattering response of the sample. This data correction process is used to obtain quantitative measurements of the nanovoid volume fraction in deformed AA6063. The SAXS results yield values comparable to existing predictions of the total vacancy volume fraction obtained from the mechanical stress-strain data.
ISSN:1478-6435
1478-6443
DOI:10.1080/14786435.2017.1340684