Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope

A simultaneous high-resolution x-ray backlighting and self-emission imaging method for laser-produced plasma diagnostics is developed in which two Kirkpatrick–Baez imaging channels for high-energy and low-energy diagnostics are constructed using a combination of multilayer mirrors in near-coaxial fo...

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Bibliographic Details
Published in:Matter and radiation at extremes 2022-01, Vol.7 (1), p.015902-015902-6
Main Authors: Yi, S. Z., Dong, J. Q., Jiang, L., Huang, Q. S., Guo, E. F., Z. S., Wang
Format: Article
Language:English
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Summary:A simultaneous high-resolution x-ray backlighting and self-emission imaging method for laser-produced plasma diagnostics is developed in which two Kirkpatrick–Baez imaging channels for high-energy and low-energy diagnostics are constructed using a combination of multilayer mirrors in near-coaxial form. By using a streak or framing camera placed on the image plane, both backlit and self-emission images of a laser-produced plasma with high spatial and temporal resolution can be obtained simultaneously in a single shot. This paper describes the details of the method with regard to its optical and multilayer design, assembly, and alignment method. In addition, x-ray imaging results with a spatial resolution better than 5 µm in the laboratory and experimental results with imploding capsules in the SG-III prototype laser facility are presented.
ISSN:2468-2047
2468-080X
2468-080X
DOI:10.1063/5.0062758