Studies on forming gas annealing treated BiFeO3 thin films and capacitors

The structure and electric properties of BiFeO3(BFO)∕BaPbO3(BPO) and Pt/BFO/BPO capacitors with forming gas annealing (FGA) treatment were investigated. X-ray diffraction patterns indicated that the annealing did not affect the structure and phase of BFO films. A degraded electric property was obtai...

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Bibliographic Details
Published in:Applied physics letters 2007-11, Vol.91 (20)
Main Authors: Lee, Chia-Ching, Wu, Lin-Jung, Wu, Jenn-Ming
Format: Article
Language:English
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Summary:The structure and electric properties of BiFeO3(BFO)∕BaPbO3(BPO) and Pt/BFO/BPO capacitors with forming gas annealing (FGA) treatment were investigated. X-ray diffraction patterns indicated that the annealing did not affect the structure and phase of BFO films. A degraded electric property was obtained in FGA-treated Pt/BFO/BPO films. It can be attributed to the formation of reduction and incomplete reduction of Bi+3 of BFO. Retention and fatigue properties were obtained in FGA-treated BPO/BFO/BPO capacitors. The normalized Pr loss was 22.8% after applying a voltage above 2Vc (coercive voltage) with 1011cycles. The retention behavior within 30000s is governed by the logarithmic time dependence.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2806191