High energy operation of the Tokyo-electron beam ion trap/present status

We are using the Tokyo electron beam ion trap (Tokyo-EBIT) to study a wide range of the physics of highly charged ions. Transition wavelengths have been investigated using visible and x-ray spectroscopy. The charge-state distributions of the extracted ions from the trap are shown for the different e...

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Bibliographic Details
Published in:Review of Scientific Instruments 2000-02, Vol.71 (2), p.687-689
Main Authors: Kuramoto, Hideharu, Shimizu, Hiroshi, Nakamura, Nobuyuki, Currell, Fredric J., Kato, Daiji, Kinugawa, Tohru, Tong, Xiao M., Watanabe, Hirofumi, Fukami, Tsunemitsu, Li, Yueming, Ohtani, Shunsuke, Sokell, Emma J., Yamada, Chikashi, Hirayama, Takato, Motohashi, Kenji, Tsurubuchi, Seiji, Okazaki, Kiyohiko, Sakurai, Makoto, Tarbutt, Michael R., Silver, Joshua D.
Format: Article
Language:eng
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Summary:We are using the Tokyo electron beam ion trap (Tokyo-EBIT) to study a wide range of the physics of highly charged ions. Transition wavelengths have been investigated using visible and x-ray spectroscopy. The charge-state distributions of the extracted ions from the trap are shown for the different experimental conditions. Ionization cross sections are measured by observing the time dependence of the charge state evolution in the extracted ions. A brief introduction of the recent studies is given.
ISSN:0034-6748
1089-7623