Distribution of the critical current density and flux trapping in YBa2Cu3O7−δ ramp-edge Josephson junctions

We have studied the spatial distribution of the critical current density in YBa2Cu3O7−δ ramp edge Josephson junctions using low-temperature scanning electron microscopy. Applying this technique allows the imaging of the critical current density distribution with a spatial resolution of about 1 μm. O...

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Bibliographic Details
Published in:Applied physics letters 1994-01, Vol.64 (2), p.241-243
Main Authors: Marx, A., Husemann, K.-D., Mayer, B., Nissel, T., Gross, R., Verhoeven, M. A. J., Gerritsma, G. J.
Format: Article
Language:English
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Summary:We have studied the spatial distribution of the critical current density in YBa2Cu3O7−δ ramp edge Josephson junctions using low-temperature scanning electron microscopy. Applying this technique allows the imaging of the critical current density distribution with a spatial resolution of about 1 μm. Our measurements show that the geometry of the ramp-edge junction eases the trapping of magnetic flux quanta in the YBa2Cu3O7−δ layer covering the ramp edge. These trapped flux quanta result in a spatially inhomogeneous magnetic field parallel to the barrier layer, which in turn results in a spatially modulated supercurrent density and an unusual magnetic field dependence of the critical current.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.111516