Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects

X-ray Standing Wave (XSW) is a well established formalism for modelling Grazing Incidence X-ray Fluorescence (GIXRF) experiments. However, when probing nanostructured surfaces with complex morphology the effects of the interaction of the XSW with structure elements need to be investigated. This is n...

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Bibliographic Details
Published in:Journal of analytical atomic spectrometry 2013-01, Vol.28 (5), p.689-696
Main Authors: Nowak, Stanis aw H, Reinhardt, Falk, Beckhoff, Burkhard, Dousse, Jean-Claude, Szlachetko, Jakub
Format: Article
Language:English
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Summary:X-ray Standing Wave (XSW) is a well established formalism for modelling Grazing Incidence X-ray Fluorescence (GIXRF) experiments. However, when probing nanostructured surfaces with complex morphology the effects of the interaction of the XSW with structure elements need to be investigated. This is not always easy and sometimes even not possible. In the present work a novel approach employing Geometrical Optics (GO) calculations is proposed. The model is employed for simulations of two different types of nano-particles distributed on a flat surface. It is shown that GO simulation yields results with good agreement when compared to absolute measurements even when XSW deteriorates. A novel approach to GIXRF spectra simulations employing geometrical optics formalism is presented.
ISSN:0267-9477
1364-5544
DOI:10.1039/c3ja30338a