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Thermodynamic pathway for the formation of SnSe and SnSe2 polycrystalline thin films by selenization of metal precursors

In this work, tin selenide thin films (SnSe x ) were grown on soda lime glass substrates by selenization of dc magnetron sputtered Sn metallic precursors. Selenization was performed at maximum temperatures in the range 300 °C to 570 °C. The thickness and the composition of the films were analysed us...

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Bibliographic Details
Published in:CrystEngComm 2013-01, Vol.15 (47), p.1278-1286
Main Authors: Fernandes, P. A, Sousa, M. G, Salomé, P. M. P, Leitão, J. P, da Cunha, A. F
Format: Article
Language:English
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Summary:In this work, tin selenide thin films (SnSe x ) were grown on soda lime glass substrates by selenization of dc magnetron sputtered Sn metallic precursors. Selenization was performed at maximum temperatures in the range 300 °C to 570 °C. The thickness and the composition of the films were analysed using step profilometry and energy dispersive spectroscopy, respectively. The films were structurally and optically investigated by X-ray diffraction, Raman spectroscopy and optical transmittance and reflectance measurements. X-Ray diffraction patterns suggest that for temperatures between 300 °C and 470 °C, the films are composed of the hexagonal-SnSe 2 phase. By increasing the temperature, the films selenized at maximum temperatures of 530 °C and 570 °C show orthorhombic-SnSe as the dominant phase with a preferential crystal orientation along the (400) crystallographic plane. Raman scattering analysis allowed the assignment of peaks at 119 cm −1 and 185 cm −1 to the hexagonal-SnSe 2 phase and those at 108 cm −1 , 130 cm −1 and 150 cm −1 to the orthorhombic-SnSe phase. All samples presented traces of condensed amorphous Se with a characteristic Raman peak located at 255 cm −1 . From optical measurements, the estimated band gap energies for hexagonal-SnSe 2 were close to 0.9 eV and 1.7 eV for indirect forbidden and direct transitions, respectively. The samples with the dominant orthorhombic-SnSe phase presented estimated band gap energies of 0.95 eV and 1.15 eV for indirect allowed and direct allowed transitions, respectively. Reaction schematics of the SnSe and SnSe 2 growth for a) low selenization temperature profiles (300 °C → 470 °C) and for b) high selenization temperature profiles (530 °C → 570 °C).
ISSN:1466-8033
1466-8033
DOI:10.1039/c3ce41537f