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Comprehensive rear surface passivation of superstrate Sb 2 Se 3 solar cells via post-deposition selenium annealing treatments and the application of an electron blocking layer
Sb 2 Se 3 , a quasi-1D structured binary chalcogenide, has great potential as a solar cell light absorber owing to its anisotropic carrier transport and benign grain boundaries when the absorber layer is properly aligned along the [ hk 1] direction perpendicular to the substrate. A growth technique...
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Published in: | Faraday discussions 2022-10, Vol.239, p.263-272 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Sb
2
Se
3
, a quasi-1D structured binary chalcogenide, has great potential as a solar cell light absorber owing to its anisotropic carrier transport and benign grain boundaries when the absorber layer is properly aligned along the [
hk
1] direction perpendicular to the substrate. A growth technique with a high deposition rate, such as vapor transport deposition, is preferred to form an [
hk
1]-oriented Sb
2
Se
3
film. However, the possible decomposition of Sb
2
Se
3
during cooling after the high-temperature deposition appears to result in Se deficiency, accompanied by the formation of deep-level donor-like defects, such as Se vacancies and Sb on Se antisite defects. Here, we present comprehensive passivation strategies for the rear interface of Sb
2
Se
3
solar cells in a superstrate configuration, namely a post-deposition annealing treatment (PAT) under Se, and the introduction of an electron-blocking layer between Sb
2
Se
3
and the rear metal contact. The PAT effectively passivated the defects associated with Se deficiency and greatly improved the open-circuit voltage and fill factor of Sb
2
Se
3
solar cells. With the further introduction of a poly(
N
,
N
-bis(4-butylphenyl)–
N
,
N
-bis(phenyl)benzidine) electron-blocking layer, the Sb
2
Se
3
solar cell achieved an efficiency of 7.0%. |
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ISSN: | 1359-6640 1364-5498 |
DOI: | 10.1039/D1FD00056J |