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Tunable Electron and Hole Injection Enabled by Atomically Thin Tunneling Layer for Improved Contact Resistance and Dual Channel Transport in MoS 2 /WSe 2 van der Waals Heterostructure
Two-dimensional (2D) material-based heterostructures provide a unique platform where interactions between stacked 2D layers can enhance the electrical and opto-electrical properties as well as give rise to interesting new phenomena. Here, the operation of a van der Waals heterostructure device compr...
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Published in: | ACS applied materials & interfaces 2018-07, Vol.10 (28), p.23961-23967 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Two-dimensional (2D) material-based heterostructures provide a unique platform where interactions between stacked 2D layers can enhance the electrical and opto-electrical properties as well as give rise to interesting new phenomena. Here, the operation of a van der Waals heterostructure device comprising of vertically stacked bilayer MoS
and few layered WSe
has been demonstrated in which an atomically thin MoS
layer has been employed as a tunneling layer to the underlying WSe
layer. In this way, simultaneous contacts to both MoS
and WSe
2D layers have been established by forming a direct metal-semiconductor to MoS
and a tunneling-based metal-insulator-semiconductor contacts to WSe
, respectively. The use of MoS
as a dielectric tunneling layer results in an improved contact resistance (80 kΩ μm) for WSe
contact, which is attributed to reduction in the effective Schottky barrier height and is also confirmed from the temperature-dependent measurement. Furthermore, this unique contact engineering and type-II band alignment between MoS
and WSe
enables a selective and independent carrier transport across the respective layers. This contact engineered dual channel heterostructure exhibits an excellent gate control and both channel current and carrier types can be modulated by the vertical electric field of the gate electrode, which is also reflected in the on/off ratio of 10
for both electron (MoS
) and hole (WSe
) channels. Moreover, the charge transfer at the heterointerface is studied quantitatively from the shift in the threshold voltage of the pristine MoS
and the heterostructure device, which agrees with the carrier recombination-induced optical quenching as observed in the Raman spectra of the pristine and heterostructure layers. This observation of dual channel ambipolar transport enabled by the hybrid tunneling contacts and strong interlayer coupling can be utilized for high-performance opto-electrical devices and applications. |
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ISSN: | 1944-8244 1944-8252 |
DOI: | 10.1021/acsami.8b05549 |