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Physical Properties of Candidate X-Ray Detector Material Rb 4 Ag 2 BiBr 9
Recently, metal halide perovskites have emerged as promising semiconductor candidates for sensitive X-ray photon detection due to their suitable bandgap energies, excellent charge transport properties, and low material cost afforded by their low-temperature solution-processing preparation. Here, we...
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Published in: | Crystal growth & design 2022-02, Vol.22 (2), p.1066-1072 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Recently, metal halide perovskites have emerged as promising semiconductor candidates for sensitive X-ray photon detection due to their suitable bandgap energies, excellent charge transport properties, and low material cost afforded by their low-temperature solution-processing preparation. Here, we report an improved methodology for single crystal (SC) growth, thermal and electrical properties of a two-dimensional (2D) layered halide material Rb
Ag
BiBr
, which has been identified as a potential candidate for X-ray radiation detection applications. The measured heat capacity for Rb
Ag
BiBr
implies that there are no structural phase transitions upon cooling. Temperature dependence of thermal transport measurements further suggest remarkably low thermal conductivities of Rb
Ag
BiBr
that are comparable to the lowest reported in literature. The bulk crystal resistivity is determined to be 2.59×10
Ω·cm from the current-voltage (I-V) curve. Density of trap states are estimated to be ~10
cm
using the space-charge-limited-current (SCLC) measurements. The fabricated Rb
Ag
BiBr
-based X-ray detector shows good operational stability with no apparent current drift, which may be ascribed to the 2D crystal structure of Rb
Ag
BiBr
. Finally, by varying the X-ray tube current to change the corresponding dose rate, the Rb
Ag
BiBr
X-ray detector sensitivity is determined to be 222.03 uCGy
cm
(at an electric field of E = 24 V/mm). |
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ISSN: | 1528-7483 1528-7505 |
DOI: | 10.1021/acs.cgd.1c00986 |