Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Bibliographic Details

Published in:	Microscopy and microanalysis 2009-07, Vol.15 (S2), p.138-139
Main Authors:	Chang, L-Y, Lazar, S, Bártová, B, Botton, GA, Hébert, C, Morral, A Fontcuberta i
Format:	Article
Language:	English
Subjects:	Microscopy and Microanalysis of Nanostructured Materials Physical Sciences
Citations:	Items that cite this one
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!