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In situ synchrotron X-ray studies of PbTiO3 thin films
We have used in situ synchrotron x‐ray scattering to investigate PbTiO3 films grown epitaxially on SrTiO3 (001) substrates. When the films are cooled below a thickness‐dependent Curie temperature, the ferroelectric phase forms as 180° stripe domains with a well‐defined period. With further cooling,...
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Published in: | Annalen der Physik 2004-01, Vol.13 (1-2), p.27-30 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | We have used in situ synchrotron x‐ray scattering to investigate PbTiO3 films grown epitaxially on SrTiO3 (001) substrates. When the films are cooled below a thickness‐dependent Curie temperature, the ferroelectric phase forms as 180° stripe domains with a well‐defined period. With further cooling, the period changes fairly abruptly from a lower to a higher value, suggesting a transition between two stripe domain phases. The periods of both stripe phases are observed to depend on the square root of film thickness, in agreement with theory. |
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ISSN: | 0003-3804 1521-3889 |
DOI: | 10.1002/andp.200310037 |