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In situ synchrotron X-ray studies of PbTiO3 thin films

We have used in situ synchrotron x‐ray scattering to investigate PbTiO3 films grown epitaxially on SrTiO3 (001) substrates. When the films are cooled below a thickness‐dependent Curie temperature, the ferroelectric phase forms as 180° stripe domains with a well‐defined period. With further cooling,...

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Bibliographic Details
Published in:Annalen der Physik 2004-01, Vol.13 (1-2), p.27-30
Main Authors: Fong, D.D., Thompson, C., Streiffer, S.K., Eastman, J.A., Auciello, O., Fuoss, P.H., Stephenson, G.B.
Format: Article
Language:English
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Summary:We have used in situ synchrotron x‐ray scattering to investigate PbTiO3 films grown epitaxially on SrTiO3 (001) substrates. When the films are cooled below a thickness‐dependent Curie temperature, the ferroelectric phase forms as 180° stripe domains with a well‐defined period. With further cooling, the period changes fairly abruptly from a lower to a higher value, suggesting a transition between two stripe domain phases. The periods of both stripe phases are observed to depend on the square root of film thickness, in agreement with theory.
ISSN:0003-3804
1521-3889
DOI:10.1002/andp.200310037