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  1. 1
    Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore.
    Published 2006
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  2. 2
    ASICON 2007 2007 7th International Conference on ASIC proceeding : October 25-29, 2007, Guilin, China / editors, Ting-Ao Tang, Wei Li ; [sponsored by Chinese Institute of Electronics (CIE) ; co-sponsored by IEEE Beijing Section ... et al.].
    Published 2007
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  3. 3
    Proceedings of 2008 International Conference on Condition Monitoring and Diagnosis CMD 2008, Beijing, China, April 21-24, 2008 / sponsored by IEEE ... [et al.] ; organized by Beijing Area Major Laboratory of High Voltage & EMC, North China Electric Power University.
    Published 2008
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  4. 4
    ICMTS 2006 proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / sponsored by the IEEE Electron Devices Society.
    Published 2006
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  5. 5
    2006 IEEE Autotestcon IEEE Systems Readiness Technology Conference : proceedings, integrating maintenance into the DoD Net-Centric Environment / sponsors, IEEE Instrumentation & Measurement Society, Aerospace & Electronics Systems Society, Los Angeles Council, and Orange County Sections.
    Published 2006
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  6. 6
    Sixth International Workshop on Microprocessor Test and Verification common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang].
    Published 2006
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  7. 7
    2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society].
    Published 2007
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  8. 8
    2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era proceedings : September 2-5, 2007, Rabat, Marocco [i.e. Morocco] / editors, Said Hamdioui and Alex Orailoglu.
    Published 2007
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  9. 9
    Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 11-13, 2007, Krakow, Poland / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.].
    Published 2007
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  10. 10
    Autotestcon 2007 Baltimore Inner Harbor, September 17-20 : IEEE Autotestcon 2007, Systems Readiness Technology Conference : proceedings, "transforming maintenance, closing the loop between ATE and integrated diagnostics" / sponsored by, the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society.
    Published 2007
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  11. 11
    Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.
    Published 2007
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  12. 12
    2007 IEEE International High Level Design Validation and Test Workshop proceedings : November 7-9, 2007, Irvine, California / sponsored by IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical Committee.
    Published 2007
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  13. 13
    Proceedings, Testing: Academic and Industry Conference--Practice and Research Techniques TAIC PART 2008 : 29-31, August 2008, Windsor, United Kingdom.
    Published 2008
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  14. 14
    Prognostics and Health Management, 2008, PHM 2008, International Conference on
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  15. 15
    2007 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT '07)
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  16. 16
    2008 IEEE International High-Level Design Validation and Test Workshop proceedings : November 19-21, 2008, Incline Village, Nevada / sponsored by IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical Committee.
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  17. 17
    2008 IEEE International Conference on Software Testing, Verification, and Validation Workshop (ICSTW '08)
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  18. 18
    LATW 2009 10th Latin-American Test Workshop : Buzios, Rio de Janeiro, Brazil, March 205, 2009.
    Published 2009
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  19. 19
    IDT 2007 the 2007 2nd International Design and Test Workshop : proceedings : December 16-18, 2007, Grand Hyatt Hotel, Cairo, Egypt / edited by Yervant Zorian ... [et al.].
    Published 2007
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  20. 20
    2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis ICTD '09, Chengdu, China, April 28-29, 2009 / edited by Bing Long and Wenjiang Li.
    Published 2009
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