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Showing 1 - 7 results of 7 for search '"Integrated circuits Very large scale integration Testing Congresses."' Refine Results
  1. 1
    24th IEEE VLSI Test Symposium proceedings : April 30-May 4, 2006, Berkeley, California / sponsored by IEEE Computer Society Test Technology Technical Council.
    Published 2006
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  2. 2
    25th IEEE VLSI Test Symposium proceedings : 6-10 May, 2007, Berkeley, California / [sponsored by] IEEE Computer Society.
    Published 2007
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  3. 3
    26th IEEE VLSI Test Symposium proceedings : San Diego, California, 27 April - 1 May 2008 / [sponsored by] IEEE Computer Society.
    Published 2008
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  4. 4
    2009 27th IEEE VLSI Test Symposium proceedings : 37 May 2009 Santa Cruz, CA, USA ; VTS 2009 / [sponsored by] IEEE Computer Society.
    Published 2009
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  5. 5
    IDT 2007 the 2007 2nd International Design and Test Workshop : proceedings : December 16-18, 2007, Grand Hyatt Hotel, Cairo, Egypt / edited by Yervant Zorian ... [et al.].
    Published 2007
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  6. 6
    Formal VLSI specification and synthesis : VLSI design methods, I : Proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design / sponsored by IMEC, Houthalen, Belgium, 13-16 November, 1989 ; edited by Luc J.M. Claesen.
    Published 1990
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses...”
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  7. 7
    Formal VLSI correctness verification : VLSI Design methods, II : proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design / sponsored by IMEC, Houthalen, Belgium, 13-16 November, 1989 ; edited by Luc J.M. Claesen.
    Published 1990
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses...”
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