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Showing 1 - 18 results of 18 for search '"Integrated circuits Very large scale integration Testing"' Refine Results
  1. 1
    VLSI testing : digital and mixed analogue/digital techniques / Stanley L. Hurst.
    Subjects: '; “...Integrated circuits Very large scale integration Testing...”
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  2. 2
    Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir.
    by Bardell, Paul H.
    Published 1987
    Subjects: '; “...Integrated circuits Very large scale integration Testing...”
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  3. 3
    24th IEEE VLSI Test Symposium proceedings : April 30-May 4, 2006, Berkeley, California / sponsored by IEEE Computer Society Test Technology Technical Council.
    Published 2006
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  4. 4
    25th IEEE VLSI Test Symposium proceedings : 6-10 May, 2007, Berkeley, California / [sponsored by] IEEE Computer Society.
    Published 2007
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  5. 5
    26th IEEE VLSI Test Symposium proceedings : San Diego, California, 27 April - 1 May 2008 / [sponsored by] IEEE Computer Society.
    Published 2008
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  6. 6
    2009 27th IEEE VLSI Test Symposium proceedings : 37 May 2009 Santa Cruz, CA, USA ; VTS 2009 / [sponsored by] IEEE Computer Society.
    Published 2009
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  7. 7
    Iddq testing for CMOS VLSI / Rochit Rajsuman.
    by Rajsuman, Rochit
    Published 1995
    Subjects: '; “...Integrated circuits Very large scale integration Testing...”
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  8. 8
    Digital circuit testing and testability / Parag K. Lala.
    by Lala, Parag K., 1948-
    Published 1997
    Subjects: '; “...Integrated circuits Very large scale integration Testing...”
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  9. 9
    Reasoning in Boolean networks : logic synthesis and verification using testing techniques / by Wolfgang Kunz and Dominik Stoffel.
    by Kunz, Wolfgang
    Published 1997
    Subjects: '; “...Integrated circuits Very large scale integration Testing Data processing...”
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  10. 10
    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
    by Bushnell, Michael L.
    Published 2000
    Subjects: '; “...Integrated circuits Very large scale integration Testing...”
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  11. 11
    IDT 2007 the 2007 2nd International Design and Test Workshop : proceedings : December 16-18, 2007, Grand Hyatt Hotel, Cairo, Egypt / edited by Yervant Zorian ... [et al.].
    Published 2007
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses....”
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  12. 12
    Formal VLSI specification and synthesis : VLSI design methods, I : Proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design / sponsored by IMEC, Houthalen, Belgium, 13-16 November, 1989 ; edited by Luc J.M. Claesen.
    Published 1990
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses...”
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  13. 13
    Formal VLSI correctness verification : VLSI Design methods, II : proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design / sponsored by IMEC, Houthalen, Belgium, 13-16 November, 1989 ; edited by Luc J.M. Claesen.
    Published 1990
    Subjects: '; “...Integrated circuits Very large scale integration Testing Congresses...”
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  14. 14
    High-level test synthesis of digital VLSI circuits / Mike Tien-Chien Lee.
    by Lee, Mike Tien-Chien
    Published 1997
    Subjects: '; “...Integrated circuits Very large scale integration Testing Data processing...”
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  15. 15
    Eighth International Symposium on Quality Electronic Design ISQED 2007 : proceedings : San Jose, California : 26-28 March, 2007 / [technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.].
    Published 2007
    Subjects: '; “...Integrated circuits Very large scale integration Testing Quality control Congresses....”
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  16. 16
    Ninth International Symposium on Quality Electronic Design ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 / technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.].
    Published 2008
    Subjects: '; “...Integrated circuits Very large scale integration Testing Quality control Congresses....”
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  17. 17
    7th International Symposium on Quality Electronic Design ISQED 2006, proceedings : 27-29 March 2006, San Jose, California / technical sponsors, IEEE Electron Devices Society & IEEE CPTM ; cooperating entities, IEEE CASS ... [et al.] ; corporate & media sponsors, Mentor Graphics ... [et al.].
    Published 2006
    Subjects: '; “...Integrated circuits Very large scale integration Testing Quality control Congresses....”
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  18. 18
    Proceedings of the First Asia Symposium on Quality Electronic Design ASQED 2009 : July 15-16, 2009 : Kuala Lumpur, Malaysia.
    Published 2009
    Subjects: '; “...Integrated circuits Very large scale integration Testing Quality control Congresses....”
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