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Wafer-scale integration
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Wafer-scale integration
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Integrated circuits
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Wafer-scale integration
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Gate dielectric integrity material, process, and tool qualification / Dinesh C. Gupta and George A. Brown, editors.
Published 2000
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Electronic and photonic packaging, electrical systems and photonic design, and nanotechnology presented at the 2002 ASME International Mechanical Engineering Congress and Expositio...
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2006 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 / sponsored by the IEEE Elect...
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2007 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 15-18, 2007 / sponsored by the IEEE Elect...
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International Integrated Reliability Workshop South Lake Tahoe, Calif
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Brown, George A., 1937-
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Conference on Gate Dielectric Integrity San Jose, Calif
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Gupta, D. C. (Dinesh C.)
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International Mechanical Engineering Congress and Exposition
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Proceedings of Electronic and photonic packaging, electrical systems and photonic design, and nanotechnology New Orleans, La
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