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  1. 161
    Fourth IEEE International Workshop on Electronic Design, Test and Applications editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with industrial co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, UK, National Instruments ; in cooperation with Chinese University of Hong Kong.
    Published 2008
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  2. 162
    Ninth International Symposium on Quality Electronic Design ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 / technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.].
    Published 2008
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  3. 163
    Journal of biopharmaceutical statistics
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  4. 164
    Proceedings of 2008 International Conference on Condition Monitoring and Diagnosis CMD 2008, Beijing, China, April 21-24, 2008 / sponsored by IEEE ... [et al.] ; organized by Beijing Area Major Laboratory of High Voltage & EMC, North China Electric Power University.
    Published 2008
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  5. 165
    SDEMPED 2005 International Symposium on Diagnostics of Electric Machines, Power Electronics, and Drives : Vienna, Austria, 7-9 September 2005.
    Published 2008
    Access restricted to subscribers
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  6. 166
    14th Asian Test Symposium proceedings : Calcutta, India, December 18-21, 2005.
    Published 2005
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  7. 167
    7th International Symposium on Quality Electronic Design ISQED 2006, proceedings : 27-29 March 2006, San Jose, California / technical sponsors, IEEE Electron Devices Society & IEEE CPTM ; cooperating entities, IEEE CASS ... [et al.] ; corporate & media sponsors, Mentor Graphics ... [et al.].
    Published 2006
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  8. 168
    24th IEEE VLSI Test Symposium proceedings : April 30-May 4, 2006, Berkeley, California / sponsored by IEEE Computer Society Test Technology Technical Council.
    Published 2006
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  9. 169
    Eleventh IEEE European Test Symposium ETS 2006 : proceedings : 21-24 May, 2006, [Hilton Hotel] Southampton, United Kingdom.
    Published 2006
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  10. 170
    ICMTS 2006 proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / sponsored by the IEEE Electron Devices Society.
    Published 2006
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  11. 171
    Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2006, Prague, Czech Republic / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Czech Technical University in Prague.
    Published 2006
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  12. 172
    Proceedings of the 15th Asian Test Symposium 20-23 November 2006, Fukuoka, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC), Technical Group on Dependable Computing, ISS, IEICE, Kyushu Institute of Technology.
    Published 2006
    Connect to this title online; UW restricted
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  13. 173
    2006 IEEE Autotestcon IEEE Systems Readiness Technology Conference : proceedings, integrating maintenance into the DoD Net-Centric Environment / sponsors, IEEE Instrumentation & Measurement Society, Aerospace & Electronics Systems Society, Los Angeles Council, and Orange County Sections.
    Published 2006
    Restricted to IEEE Xplore subscribers
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  14. 174
    Seventh International Workshop on Microprocessor Test and Verification proceedings : MTV 2006 : Austin, Texas, 4-5 December, 2006 / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC).
    Published 2007
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  15. 175
    25th IEEE VLSI Test Symposium proceedings : 6-10 May, 2007, Berkeley, California / [sponsored by] IEEE Computer Society.
    Published 2007
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  16. 176
    ITC International Test Conference 2006 proceedings : October 24-October 26, 2006, Santa Clara Convention Center, Santa Clara, California USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
    Published 2006
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  17. 177
    ICCAD-2006 IEEE/ACM International Conference on Computer Aided Design : IEEE/ACM digest of technical papers : DoubleTree Hotel, San Jose, San Jose, California, November 5-9, 2006 / sponsored by IEEE Circuits & Systems Society ... [et al.].
    Published 2006
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  18. 178
    Sixth International Workshop on Microprocessor Test and Verification common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005 / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang].
    Published 2006
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  19. 179
    2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society].
    Published 2007
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  20. 180
    2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era proceedings : September 2-5, 2007, Rabat, Marocco [i.e. Morocco] / editors, Said Hamdioui and Alex Orailoglu.
    Published 2007
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