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  1. 1
    7th International Symposium on Quality Electronic Design ISQED 2006, proceedings : 27-29 March 2006, San Jose, California / technical sponsors, IEEE Electron Devices Society & IEEE CPTM ; cooperating entities, IEEE CASS ... [et al.] ; corporate & media sponsors, Mentor Graphics ... [et al.].
    Published 2006
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  2. 2
    Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore.
    Published 2006
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  3. 3
    Eighth International Symposium on Quality Electronic Design ISQED 2007 : proceedings : San Jose, California : 26-28 March, 2007 / [technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.].
    Published 2007
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  4. 4
    Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2008 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE ED/SSC Chapter.
    Published 2008
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  5. 5
    Continuous delivery / Jez Humble and David Farley ; [foreword by Martin Fowler].
    by Humble, Jez
    Published 2011
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  6. 6
    PEM fuel cell failure mode analysis / edited by Haijiang Wang, Xiao-Zi Yuan, Hui Li.
    Published 2012
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  7. 7
    Composite joints and connections : principles, modelling and testing / edited by Pedro Camanho and Liyong Tong.
    Published 2011
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  8. 8
    PEM fuel cell failure mode analysis edited by Haijiang Wang, Xiao-Zi Yuan, Hui Li.
    Published 2012
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  9. 9
    Ninth International Symposium on Quality Electronic Design ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 / technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.].
    Published 2008
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  10. 10
    Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.
    Published 2007
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  11. 11
    Accelerated stress testing handbook guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.
    Published 2001
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  12. 12
    Software testing, verification and reliability
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    Serial
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  13. 13
    Continuous integration : improving software quality and reducing risk / Paul M. Duvall with Steve Matyas and Andrew Glover.
    by Duvall, Paul M.
    Published 2007
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  14. 14
    Low-power HF microelectronics a unified approach / edited by Gerson A.S. Machado.
    Published 1996
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  15. 15
    Statistical techniques for high-voltage engineering W. Hauschild & W. Mosch.
    by Hauschild, Wolfgang
    Published 1992
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  16. 16
    Fatigue life of riveted steel bridges / Bjorn Akesson.
    by Åkesson, B. (Björn)
    Published 2010
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  17. 17
    Relation of testing and service performance a symposium presented at the sixty-ninth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 26 June-1 July, 1966.
    Published 1967
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  18. 18
    Mechanical fault diagnosis and condition monitoring.
    by Collacott, Ralph Albert
    Published 1977
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  19. 19
    Nondestructive testing of pavements and backcalculation of moduli Albert J. Bush III and Gilbert Y. Baladi, editors.
    Published 1989
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  20. 20
    Proceedings of 2008 International Conference on Condition Monitoring and Diagnosis CMD 2008, Beijing, China, April 21-24, 2008 / sponsored by IEEE ... [et al.] ; organized by Beijing Area Major Laboratory of High Voltage & EMC, North China Electric Power University.
    Published 2008
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