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  1. 1
    How to test almost everything electronic / Delton T. Horn.
    by Horn, Delton T.
    Published 1993
    Edition: 3rd ed.
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  2. 2
    Consumer electronics component handbook : how to identify, locate, and test consumer electronic components.
    by Davidson, Homer L.
    Published 1998
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  3. 3
    Lock-in thermography : basics and use for evaluating electronic devices and materials.
    by Breitenstein, O. (Otwin)
    Published 2010
    Edition: 2nd ed. /
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  4. 4
    Test and measurement world
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  5. 5
    ICMTS 2006 proceedings of the 2006 International Conference on Microelectronic Test Structures, Hyatt on Town Lake, Austin, Texas, March 6-9, 2006 / sponsored by the IEEE Electron Devices Society.
    Published 2006
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  6. 6
    2007 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society].
    Published 2007
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  7. 7
    Design for at-speed test, diagnosis and measurement / edited by Benoit Nadeau-Dostie.
    Published 2000
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  8. 8
    A designer's guide to built-in self-test / Charles E. Stroud.
    by Stroud, Charles E.
    Published 2002
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  9. 9
    Journal of electronic testing
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  10. 10
    How to get your electronic projects working / by R.A. Penfold.
    by Penfold, R. A.
    Published 1982
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  11. 11
    Computer integrated electronics manufacturing and testing / Jack Arabian.
    by Arabian, Jack
    Published 1989
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  12. 12
    Electronic testing and fault diagnosis / (by) George Loveday.
    by Loveday, George
    Published 1980
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  13. 13
    LATW 2009 10th Latin-American Test Workshop : Buzios, Rio de Janeiro, Brazil, March 205, 2009.
    Published 2009
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  14. 14
    Accelerated stress testing handbook guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.
    Published 2001
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  15. 15
    A Handbook for EMC testing and measurement / David Morgan.
    by Morgan, David, 1948-
    Published 1994
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  16. 16
    2008 IEEE International Conference on Microelectronic Test Structures ICMTS : conference proceedings : March 24-27, the University of Edinburgh, UK.
    Published 2008
    Access restricted to subscribers
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