Showing
1 - 3
results of
3
for search '
'
Skip to content
University Library
Library Catalogue Plus
Toggle navigation
New Search
Subject Guides (including databases)
Your Account
Log Out
Login
Language
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
English
Catalogue
Articles Plus
All Fields
Title
Author
Subject
Shelfmark
ISBN/ISSN
Tag
Find
Advanced Search
Reset Filters
Suggested Topics:
Microprocessors
Author:
IEEE Computer Society. Design Automation Technical Committee
Reset Filters
Show filters (2)
Suggested Topics:
Microprocessors
Author:
IEEE Computer Society. Design Automation Technical Committee
Search Results
Suggested Topics within your search.
Suggested Topics within your search.
Computer software
3
Electronic circuits
3
Electronic digital computers
3
Evaluation
3
Microprocessors
Testing
3
Verification
3
Showing
1 - 3
results of
3
for search '
'
Refine Results
Sort
Relevance
Date Descending
Date Ascending
Shelfmark
Author
Title
1
Eleventh Annual IEEE International High-Level Design Validation and Test Workshop November 8-10, 2006, Monterey, California : proceedings / sponsored by IEEE Computer Society Techn...
Published 2006
Shelfmark:
Loading...
Located:
Loading...
Get full text
eBook
Save to List
Saved in:
2
2007 IEEE International High Level Design Validation and Test Workshop proceedings : November 7-9, 2007, Irvine, California / sponsored by IEEE Computer Society Test Technology Tec...
Published 2007
Shelfmark:
Loading...
Located:
Loading...
Get full text
eBook
Save to List
Saved in:
3
2008 IEEE International High-Level Design Validation and Test Workshop proceedings : November 19-21, 2008, Incline Village, Nevada / sponsored by IEEE Computer Society Test Technol...
Published 2008
Shelfmark:
Loading...
Located:
Loading...
Get full text
eBook
Save to List
Saved in:
Search Tools:
Get RSS Feed
—
Email this Search
—
Save Search
Back
Narrow Search
Library
Online Resource
3
Format
eBook
3
Year of Publication
From:
To:
Author
IEEE Computer Society. Design Automation Technical Committee
IEEE Computer Society. Technical Council on Test Technology
3
IEEE Computer Society
1
IEEE International High-Level Design Validation and Test Workshop Incline Village, Nev
1
IEEE International High-Level Design Validation and Test Workshop Irvine, Calif
1
IEEE International High-Level Design Validation and Test Workshop Monterey, Calif
1
Language
English
3
Genre
Congresses
3
© 2017 Loughborough University. All rights reserved.
Loading...