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Formal methods in computer-aided design proceedings of : 12-16 November, 2006, San Jose, California, USA / [sponsored by FMCAD Inc., IEEE Council on Electronic Design Automatiion (...
Published 2006
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DFT 2007 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy / edited by Cristiana Bolchini ... [et a...
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The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems proceedings, Boston, Massachusetts, 1-3 October 2008 / sponsored by the IEEE Computer Society Te...
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Bolchini, Cristiana
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Gupta, Aarti
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IEEE Computer Society. Fault-Tolerant Computing Technical Committee
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IEEE Council on Electronic Design Automation
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IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Boston, Mass
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IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Rome, Italy
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