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Girard, Patrick, Ph. D.
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2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology DTIS 2006 : proceedings : September 05-07, 2006, Tunis, Tunisia / [edited by Patrick Gi...
Published 2006
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Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 11-13, 2007, Krakow, Poland / sponsored by IEEE Computer Society Test Techn...
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Girard, Patrick, Ph. D.
IEEE Computer Society. Technical Council on Test Technology
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International Conference on Design & Test of Integrated Systems in Nanoscale Technology Tunis, Tunisia
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