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  1. 1
    Infra-red studies of crystal defects / (by) R.C. Newman.
    by Newman, R C
    Published 1973
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  2. 2
    Deep levels in semiconductors / M. Jaros.
    by Jaros, M.
    Published 1982
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  3. 3
    Size measurement and characterisation of weld defects by ultrasonic testing : a collaborative project carried out on behalf of the Mechanical Engineering and Machine Tools Requirements Board, Department of Industry
    Published 1979
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  4. 4
    Size measurement and characterisation of weld defects by ultrasonic testing : a collaborative project carried out on behalf of the Mechanical Engineering and Machine Tools Requirements Board, Department of Industry
    Published 1982
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  5. 5
    Size measurement and characterisation of weld defects by ultrasonic testing : a collaborative project carried out on behalf of the Mechanical Engineering and Machine Tools Requirements Board, Department of Industry
    Published 1982
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  6. 6
    Integrated circuit defect-sensitivity : theory and computational models / by José Pineda de Gyvez.
    by Pineda de Gyvez, José
    Published 1993
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  7. 7
    Structural failure in residential buildings (by) Erich Schild... (et al.); illustrations by Volker Schnapauff ; (translated from the German by Sheila Bacon).
    Published 1979
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  8. 8
    Quality conformance and qualification of microelectronic packages and interconnects / edited by Michael Pecht ... (et al.)..
    Published 1994
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  9. 9
    Wire bonding in microelectronics : materials, processes, reliability, and yield / George G. Harman.
    by Harman, George G.
    Published 1997
    Edition: 2nd ed..
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  10. 10
    Semiconductor technology : processing and novel fabrication techniques / edited by Mikhail E. Levinshtein, Michael S. Shur.
    Published 1997
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  11. 11
    Understanding housing defects / by Duncan Marshall, Derek Worthing and Roger Heath.
    by Marshall, Duncan
    Published 1998
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  12. 12
    Treatise on solid state chemistry / edited by N.B. Hannay
    Published 1973
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  13. 13
    Alkali-aggregate reaction in concrete roads and bridges Graham West.
    by West, Graham
    Published 1996
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  14. 14
    Radiation effects and defects in solids
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  15. 15
    Failure analysis of paint and coatings Dwight G. Weldon.
    by Weldon, Dwight G.
    Published 2009
    Edition: Rev. ed.
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  16. 16
    Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2006 / edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore.
    Published 2006
    Connect to this title online; UW restricted
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  17. 17
    14th IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP 2006 : October 10-13, 2006, Kyoto Brighton Hotel, Kyoto, Japan / IEEE Electron Devices Society.
    Published 2006
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  18. 18
    15th IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / IEEE Electron Devices Society.
    Published 2007
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  19. 19
    Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2007 / edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.
    Published 2007
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  20. 20
    Point defects in metals / by A.C. Damask and G.J. Dienes.
    by Damask, A. C. (Arthur C)
    Published 1963
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