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1by Vlad Kornienko, Ochai Oklobia, Stuart Irvine, Steve Jones, Amit Munshi, Walajabad Sampath, Ali Abbas, Kieran Curson, Stuart Robertson, Yau Tse, Kurt Barth, Jake Bowers, Michael WallsSubjects: '; “...Electron backscatter diffraction...”
Published 2024
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2by Rachael Greenhalgh, Vladislav Kornienko, Kerrie Morris, Ali Abbas, Jake Bowers, Michael Walls“... films are dense and columnar. The thin films have been characterized using xRay diffraction, UV-vis...”
Published 2021
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3by Rachael Greenhalgh, Vincent Tsai, Ali Abbas, Vlad Kornienko, Tom Fiducia, Mustafa Togay, K Li, Chris R.M. Grovenor, AH Danielson, Amit Munshi, KL Barth, WS Sampath, Jake Bowers, Michael Walls“... Diffraction Analysis, photoluminescence and high spatial resolution- Secondary Ion Mass Spectrometry (nanoSIMS...”
Published 2020
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4by Carl Cooper, Panagiota Arnou, Lewis Wright, Sona Ulicna, Michael Walls, Andrei Malkov, Jake Bowers“... kesterite phase using X-ray diffraction and Raman, the latter showing no distinctive signs of any binary...”
Published 2017
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5by Vladislav Kornienko, Rachael Greenhalgh, Kerrie Morris, Ali Abbas, Thomas Fiducia, Ryan Maclachlan, Yau Tse, Michael Walls, Jake Bowers“... on texture and grain size. Electron backscatter diffraction (EBSD) has been carried out using a Plasma...”
Published 2021
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6“... the substrate temperature was varied from 20 °C to 400 °C during deposition. X-ray diffraction patterns...”
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7by Vlad Kornienko, Stuart Robertson, Ryan Maclachlan, Tushar Shimpi, Walajabad Sampath, Kurt L Barth, Thomas Fiducia, Ali Abbas, Yau Tse, Jake Bowers, Michael Walls“...3D electron backscatter diffraction (3D EBSD) was carried out using a Xe-PFIB on CdTe thin film...”
Published 2021
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8by Piotr Kaminski, Fabiana Lisco, Ali Abbas, Jake Bowers, Gianfranco Claudio, Michael Walls“... films are amorphous/semi-amorphous and this was confirmed by X-ray Diffraction measurements and TEM...”
Published 2014
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9by Fabiana Lisco, Piotr Kaminski, Ali Abbas, Kevin Bass, Jake Bowers, Gianfranco Claudio, Maria Losurdo, Michael Walls“... spectroscopy, X-ray diffraction, scanning and transmission electron microscopy, spectroscopic ellipsometry...”
Published 2014
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10“... as-deposited SnO2-TiO2-WO3 thin films were found to be highly resistive. X-ray diffraction data indicated...”
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11by Vlad Kornienko, Ochai Oklobia, Stuart Irvine, Steve Jones, Giray Kartopu, Ali Abbas, Yau Tse, Jake Bowers, Kurt Barth, Michael Walls“... of the microstructure were obtained using backscattered electron imaging and electron backscatter diffraction (EBSD...”
Published 2022
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