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  1. 1
    The test access port and boundary scan architecture / Colin M. Maunder and Rodham E. Tulloss.
    by Maunder, Colin M.
    Published 1990
    “...IEEE Computer Society Press,...”
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  2. 2
    Integrating design and test : using CAE tools for ATE programming / Kenneth P. Parker.
    by Parker, Kenneth P
    Published 1987
    “...Computer Society Press of the IEEE,...”
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  3. 3
    Bridging faults and IDDQ testing / [edited by] Yashwant K. Malaiya and Rochit Rajsuman.
    Published 1992
    “...IEEE Computer Society Press,...”
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