Author
American Society for Testing and Materials
13
Society of Photo-optical Instrumentation Engineers
8
Institute of Electrical and Electronics Engineers
7
Oakland, John S.
7
ASTM International
5
Hoyle, David
5
Institute of Radio Engineers
5
Kenett, Ron
5
Evans, James R. (James Robert), 1950-
4
Faltin, Frederick W.
4
IEEE Communications Society
4
IEEE Electron Devices Society
4
IEEE Xplore (Online service)
4
Lindsay, William M.
4
Ruggeri, Fabrizio
4
Stamatis, D. H. 1947-
4
Taguchi, Genichi
4
The Institution of Engineering and Technology
4
ASTM Committee E-11 on Quality and Statistics
3
American Society for Quality Control. Chemical Interest Committee
3
Anumba, C. J. (Chimay J.)
3
Breyfogle, Forrest W., 1946-
3
Chowdhury, Subir
3
European Construction Institute
3
IS & T-- the Society for Imaging Science and Technology
3
Institution of Civil Engineers (Great Britain)
3
Institution of Electrical Engineers
3
International Symposium on Quality Electronic Design San Jose, Calif
3
Jon Petzing
3
Juran, J. M. (Joseph Moses)
3
Kamara, John M.
3
Kunst, Paul
3
Lemmink, Jos
3
Lock, Dennis, 1929-
3
Mériaudeau, Fabrice
3
Nick Medcalf
3
Pande, Peter S.
3
Price, Jeffery Ray, 1970-
3
Richard Buswell
3
Sumner, Peter
3
Thorpe, Brian
3
A. Al-Habaibeh
2
ASTM Committee D-4 on Road and Paving Materials
2
ASTM Committee E-47 on Biological Effects and Environmental Fate
2
Ackerley, Roger
2
Adam Studd
2
Akao, Yōji, 1928-
2
Alexander P. Marchant
2
American Society for Quality. Chemical Interest Committee
2
American Society for Testing and Materials. Pacific Area National Meeting
2
more ...