Author
Society of Automotive Engineers
5
Institute of Electrical and Electronics Engineers
4
IEEE ITSS
3
American Society for Testing and Materials
2
IEEE Communications Society
2
IEEE Xplore (Online service)
2
International Federation for Information Processing. Technical Committee 6
2
Jennions, Ian K.
2
Ribbens, William B.
2
ASTM Committee E-31 on Computerized Laboratory Systems
1
ASTM Committee E-7 on Non-Destructive Testing
1
Abut, Huseyin
1
American Society for Testing and Materials. Meeting
1
Biennial Workshop on DSP (Digital Signal Processing) for In-Vehicle Systems and Safety Seoul, Korea)
1
Biennial Workshop on DSP (Digital Signal Processing) for Mobile and Vehicular Systems
1
Bosomworth, Christopher
1
Braun, Teresa M.
1
Bruni, Stefano
1
China Aerospace Science and Technology Corporation
1
China Space Agency
1
Cole, Colin
1
Day, John
1
Day, John, 1944-
1
Denton, Tom
1
Eriksson, Lars, 1970-
1
Frazer, J. W.
1
Ha'erbin gong ye da xue
1
Hansen, John H. L.
1
IEE Automotive Electronics Conference
1
IEEE International Conference on Vehicular Electronics and Safety Beijing, China
1
IEEE International Conference on Vehicular Electronics and Safety Columbus, Ohio
1
IEEE International Conference on Vehicular Electronics and Safety Shanghai, China
1
IEEE Nuclear and Plasma Sciences Society
1
IEEE Nuclear and Space Radiation Effects Conference
1
IEEE Radiation Effects Data Workshop Tucson, Ariz
1
ISSCAA 2006 Harbin, China
1
Institution of Engineering and Technology
1
Jimenez, Felipe
1
Jukes, Malcolm
1
Kunz, F. W.
1
Mansour, Norman P.
1
Miller, John M.
1
Moir, I. (Ian)
1
Nielsen, Lars, 1955-
1
Nikolopoulos, Christos D., 1981-
1
Palocz-Andresen, Michael
1
Seabridge, A. G. (Allan G.)
1
Spiryagin, Maksym
1
Symposium on Computerized Laboratory Systems Cleveland, Ohio
1
Symposium on Ultrasonic Testing Atlantic City, N.J.
1
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