Author
IGI Global
10
IEEE Computer Society. Technical Council on Test Technology
7
IEEE Xplore (Online service)
7
Fry, Tony
4
IEEE Computer Society
4
Gleiniger, Andrea
3
Institute of Electrical and Electronics Engineers. Central Texas Section
3
Pink, Sarah
3
Shamiyeh, Michael
3
Vrachliotis, Georg
3
Walker, Stuart, 1955-
3
Yee, Joyce
3
American Society for Testing and Materials
2
Barr, D. I. H.
2
Bott, Cornelia
2
Brandes, Uta
2
Bruyns, Gerhard
2
Bürdek, Bernhard E.
2
Chakrabarti, Amaresh
2
Comite euro-international du beton
2
Coyne, Richard
2
DiSalvo, Carl, 1971-
2
Dixon, Brian S.
2
Dudek, Mark
2
Erlhoff, Michael
2
Garrett, Patrick H.
2
Girard, Patrick, Ph. D.
2
Institute of Electrical and Electronics Engineers
2
International Conference on Integrated Circuit Design and Technology Austin, Tex
2
Jafari, Ali
2
Krippendorff, Klaus
2
Kurniawan, Sri, 1970-
2
Lenk, Carol
2
Lenk, Ron, 1958-
2
Lewis, Helen
2
Lockwood, Thomas
2
Meroni, Anna
2
National Instruments (Firm)
2
Norman, Don
2
Oyo Butsuri Gakkai
2
Pacejka, Hans B.
2
Peters, Sascha
2
ProQuest (Firm)
2
Royal Society of Chemistry (Great Britain)
2
Schittich, Christian
2
Sheehan, Mark (Mark C.)
2
Smith, Rachel Charlotte
2
Stich, Sonja
2
Stolterman, Erik
2
Terstiege, Gerrit
2
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